Four Point Probe Tester

SZT-2A Four Point Probe Tester

Overview
1) The main engine uses the world leading advanced circuit design the measured value is more precise, faster, more accurate (generation of traditional-style circuit, Disadvantages: bulky, slow, leading many components which affect life expectancy)

2) LCR display (generation to only digital tube display), automatic is standard, manual is optional

3) Matching computer interface and software (there are 232 interface and USB two kinds of interfaces) to allow easy operation and clear of (can be directly connected to a computer, the computer automatically calculate based on the input to the specified thickness, automatic mutatis mutandis, and the correction factor, so that the measured results of more accurate data can be stored or deleted, which will help to save the use of party records).

4) Second-generation test rack used automatic sensing device, close to the measured object by implementing the automatic deceleration, avoiding the loss of the detected objects and probe wear and tear (advanced to any similar products in the domestic market in a test stand, the older generation to Manual).

5) The instrument test resistance, resistivity, sheet resistance, the standardized coefficients of the machine comes with self-tuning, no need for additional manual adjustments,

6) The maximum resolution of this instrument is 0.1mΩ.

7) The test probe is the tungsten needle, in the market many probes are the high speed steel needle.



8) Each time the survey has the built-in computer to carry on the temperature compensation and the voltage electric current correction automatically

9) Overall measurement standard uncertainty: <= 2% (domestic other factory error is <= 5%)

10) Specifications

***Measuring range:
Resistivity10 -4 ~ 105Ω/cm
sheet resistance10 -4 ~ 105Ω/□
resinstance10 -4 ~ 105Ω

***Observable semiconducting material size
diameter5mm-130mm
length≤400mm

*** measuring method
Axial, the cross section may

***Display:
41 / 2, digital display, polarity, overload auto-show, a decimal point, the unit automatically displayed.

*** constant current source
(1) Electric current output: Direct current 0~100 mA continuously adjustable.
(2) range:10,100μA,1,10,100mA
(3) Error: ±0.5% reading date ±1
***Four probe test probe
(1) probe space:1mm
(2) Material: Tungsten carbide. Probe machinery vacillation rate: ±1.0%
***Power source:
220±10% 50Hz or 60Hz power loss: <35W
SZT-2A have 2 kinds of price, one is normal, another with computer Interface (USB and 232) to function when the silicon thickness <1mm readings automatically amended so that the measured data accuracy rate will be 100%. The test date was automatically generated excel form can be printed east, and also easy to save and delete.